Applied Industrial Optics Day 4
Applied Industrial Optics Day 4
By Cushla McGoverin
The final day of AIO began with “Another Day, Another Detector” and more examples of successful product development. Aaron Miller (Quantum Optics, LLC, USA) described their desktop cryogenic system that is used with their superconducting nanowire single photon detector to achieve 85% efficiency at 1550 nm. The development of a radiation pressure power meter for testing manufacturing lasers was described by Alexandra B. Artusio-Glimpse (NIST, USA). Jaeyoun Kim (Iowa State Univ., USA) described an innovative method to produce sinusoidal gratings with nanoscale volcanic texture using charge on PDMS and Cheng Zhang (NIST, USA) described doped silver films that could be used in optoelectronics.
The final session of AIO was a joint session with the Computational Optical Sensing and Imaging meeting, “Ptychography, It’s Complex.” An apt description for this session. Each talk presented a method for the collection and/or computation of ptychography-based images. Jaebum Chung (California Institute of Technology, USA) uses coded apertures to collect data from which aberrations are corrected computationally. Bing Kuan Chen and Gil Ilan Haham, both from Technion, Israel, presented a single-shot polarization-resolved ptychographic microscope and how to use this for ultra-high-speed data collection. Thomas Ardukas (Univ. of Glasgow, UK) showed how it is possible to have a $100 ptychographic microscope if you use Bayer filter colour cameras. The final talk of the meeting was given by Thanh Nguyen (Catholic Univ. of America, USA) about the use of convolution neural networks for data analysis of ptychographic microscopy data.
That’s it for AIO 2018. Thanks to the co-general chairs, Arlene Smith and Martin Garbos, the program chairs, the committee, the speakers and the attendees for making this a successful meeting.
