Gentec-EO
Events
Gentec-EO
Thursday 14 October @ 10:45 - 11:00
In-Line Monitoring of High-Power Laser Beams: Measure Beam Size and Power Simultaneously for Lasers Up to 1 kW
High-power laser processes such as laser cutting, welding and surface treatments can be greatly affected by fluctuations in your laser’s power level and by changes in its power density distribution (beam profile shape and size). Gentec-EO has designed beam-sampling modules that allow you to monitor both power and profile continuously while your laser-based process is running.
These high-quality optics divert a small fraction of your laser beam to measurement instruments, without deteriorating the quality of the main laser beam. The sampled beam is redirected in two stages: in the first stage, the main output power is directed to a beam dump or power detector. In the second stage, the beam is re-sampled orthogonally and directed towards a laser beam profiler. The compound attenuation factor is approximately 1:1900 and all the properties of the laser beams are conserved: the result is uniform attenuation of any beam shape, from Gaussian to flat-top and even doughnut.
In this showcase, we will present Gentec-EO’s beam attenuator series and its new model that can allows high-power laser beam profiling at up to 1 kW. We will also show you how to integrate a beam-sampling module in your optical system to measure high-power laser beams while your process is running.
Speaker
Félicien Legrand, US/Canada Sales Manager, Gentec-EO
Félicien Legrand is the US/Canada Sales Manager at Gentec-EO, with 11 years of field experience in North America for sales of optical measurement instruments and information technology. He holds a bachelor’s degree in physics from Université Paris-Sud and a master’s degree in commercialization of scientific instrumentation from Université Bordeaux 1 in the heart of business cluster “Route des Lasers”.
