Freeform Optics (Freeform)
Submission Deadline: 11 Feb 2025 12:00
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Freeform Optics (Freeform)
Freeform Optics explores the evolving impact of freeform optical surfaces on optical systems for both imaging and nonimaging science and technologies.
New fabrication techniques that create optical surfaces that are not surfaces of revolution open an expansive new space for optical systems. Enabled systems include illumination systems, imaging optics from microscopy to space optics, including head-worn and head-up displays, and broadband pervasive surveillance systems. But optical testing methods for these new surfaces are lacking, and the theory and implementation of an aberration theory as a basis for optical design of these surfaces was only unraveled in 2012. The scope features work on the optical design of imaging systems with freeform surfaces, evolving methods for surface representation for nonimaging system optimization and a perspective on the new challenges these surfaces present to optical testing.
Chairs
Jessica DeGroote Nelson
Edmund Optics Inc., United States,
General Chair
Fabian Duerr
Vrije Universiteit Brussel, Belgium,
General Chair
Kyle Fuerschbach
Sandia National Laboratories Albuquerque, United States,
Program Chair
Jannick Rolland
University of Rochester, United States,
Program Chair
Committee Members
- Jessica DeGroote Nelson, Edmund Optics Inc., United States, General Chair
- Fabian Duerr, Vrije Universiteit Brussel, Belgium, General Chair
- Kyle Fuerschbach, Sandia National Laboratories Albuquerque, United States, Program Chair
- Jannick Rolland, University of Rochester, United States, Program Chair
- Jeroen Cerpentier, KU Leuven, Belgium
- Scott Defisher, OptiPro Systems, United States
- Paul Dumas, QED Technologies Inc, United States
- Goldie Goldstein, Nikon Research Corporation of America, United States
- Joseph Howard, NASA Goddard Space Flight Center, United States
- John Koshel, Univ of Arizona, Coll of Opt Sciences, United States
- Thierry Lepine, Institut d'Optique Lab Hubert Curien, France
- Cormic Merle, Arizona Optical Metrology, United States
- Julius Muschaweck, JMO Illumination Optics GmbH, Germany
- Jose Sasian, Univ of Arizona, Coll of Opt Sciences, United States
- Eric Schiesser, Synopsys, Inc, United States
- Thomas Suleski, Univ of North Carolina at Charlotte, United States
- Nick Takaki, Synopsys, Inc, United States
- Wilhelm Ulrich, Carl Zeiss AG
- Garrett West, Ball Aerospace, United States
- Tong Yang, Beijing Institute of Technology, China