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Invited Speakers

Optica Design and Fabrication Congress

Flat Optics (FlatOptics)
Freeform Optics (Freeform)
Optical Fabrication and Testing (OF&T)

Flat Optics (FlatOptics)

  • Rajesh Menon, University of UtahUnited States
    Title to be Announced

Freeform Optics (Freeform)

  • Aaron Bauer, University of RochesterUnited States
  • James Burge, AOM - Arizona Optical Metrology LLCUnited States
  • Jordan Hall, Opto-Alignment Technology IncUnited States
  • Yuxuan Liu, Apple Inc.United States
    Analytical Aberration Theory for Plane-symmetric Optical Imaging Systems
  • Yunfeng Nie, Vrije Universiteit BrusselBelgium
  • Christopher Roll, MIT Lincoln LaboratoryUnited States
    Progress Toward Automated Alignment of Freeform Optics
  • Eric Ruch, Sagem SAFrance
    The Future Challenges of Freeform Optics in Space Instruments
  • Lien Smeesters, Vrije Universiteit BrusselBelgium
    Compact Wide Field-of-view Freeform Optics for Hyperspectral Earth observation
  • Rengmao Wu, Zhejiang UniversityChina
    Design and Fabrication of Freeform Holographic Optical Elements

Optical Fabrication and Testing (OF&T)

  • Robert Brunner, Ernst-Abbe-Hochschule, JenaGermany
  • M J Daniel Esser, Heriot-Watt UniversityUnited Kingdom
  • Oliver Faehnle, PanDao GmbHSwitzerland
  • Bin Fan, IOEChina
  • Young-Sik Ghim, Korea Res. Inst of Standards and ScienceRepublic Of Korea
  • Logan Graves, University of ArizonaUnited States
  • Luc Joannes, Lambda-X OphthalmicsBelgium
  • Ki-Nam Joo, Chosun UniversityRepublic Of Korea
  • Yves Jourlin, Lab Hubert Curien UMR CNRS 5516France
  • Neha Khatri, CSIR-CSIOIndia
  • Rebecca Mitchell, National Renewable Energy LaboratoryUnited States
  • Wilfried Noell, Focuslight Technologies Inc.Switzerland
  • Yuki Shimizu, Hokkaido UniversityJapan
    Multi-degree-of-freedom Optical Sensors for Precision Positioning
  • Jessica van Heck, Phabulous Pilot Line AssociationSwitzerland
  • Ye Wang, Australian National UniversityAustralia
  • Xiangchao Zhang, Fudan UniversityChina
    Deterministic Deflectometric Measurement: from Rays to Beams
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