Invited Speakers
Flat Optics (FlatOptics)
Freeform Optics (Freeform)
Optical Fabrication and Testing (OF&T)
Freeform Optics (Freeform)
Optical Fabrication and Testing (OF&T)
Flat Optics (FlatOptics)
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Rajesh Menon, University of Utah, United States
Title to be Announced
Freeform Optics (Freeform)
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Aaron Bauer, University of Rochester, United States
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James Burge, AOM - Arizona Optical Metrology LLC, United States
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Jordan Hall, Opto-Alignment Technology Inc, United States
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Yuxuan Liu, Apple Inc., United States
Analytical Aberration Theory for Plane-symmetric Optical Imaging Systems -
Yunfeng Nie, Vrije Universiteit Brussel, Belgium
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Christopher Roll, MIT Lincoln Laboratory, United States
Progress Toward Automated Alignment of Freeform Optics -
Eric Ruch, Sagem SA, France
The Future Challenges of Freeform Optics in Space Instruments -
Lien Smeesters, Vrije Universiteit Brussel, Belgium
Compact Wide Field-of-view Freeform Optics for Hyperspectral Earth observation -
Rengmao Wu, Zhejiang University, China
Design and Fabrication of Freeform Holographic Optical Elements
Optical Fabrication and Testing (OF&T)
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Robert Brunner, Ernst-Abbe-Hochschule, Jena, Germany
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M J Daniel Esser, Heriot-Watt University, United Kingdom
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Oliver Faehnle, PanDao GmbH, Switzerland
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Bin Fan, IOE, China
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Young-Sik Ghim, Korea Res. Inst of Standards and Science, Republic Of Korea
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Logan Graves, University of Arizona, United States
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Luc Joannes, Lambda-X Ophthalmics, Belgium
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Ki-Nam Joo, Chosun University, Republic Of Korea
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Yves Jourlin, Lab Hubert Curien UMR CNRS 5516, France
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Neha Khatri, CSIR-CSIO, India
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Rebecca Mitchell, National Renewable Energy Laboratory, United States
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Wilfried Noell, Focuslight Technologies Inc., Switzerland
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Yuki Shimizu, Hokkaido University, Japan
Multi-degree-of-freedom Optical Sensors for Precision Positioning -
Jessica van Heck, Phabulous Pilot Line Association, Switzerland
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Ye Wang, Australian National University, Australia
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Xiangchao Zhang, Fudan University, China
Deterministic Deflectometric Measurement: from Rays to Beams